Scanning electron microscope

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Scanning Electron Microscope (SEM)

The Nova NanoSEM 450 scanning electron microscope (SEM) delivers state-of-the-art imaging and analytical performance in a single, easy-to-use instrument. Specifically designed to streamline operations in laboratory, the Nova NanoSEM enables users the ability to obtain a comprehensive analysis of a wide range of samples.

The SEM at the Syed Babar Ali School of Science and Engineering is a field-emission machine with promised resolutions of up to 0.8 nm uder ideal imaging conditions. With built-in ETD and TLD detectors for HR and UHR imaging, some external detectors like low vacuum detector (LVD), back scattered detector (BSD) and scanning-transmission electron microscope detector (STEM) are also available and can be activated according to requirements. The microscope is also equipped with very highly precise Oxford energy dispersive X-ray (EDX) detector for qualitative and quantitative compositional analysis. The point, line and map scans with composition measurements can easily be extracted from the samples with this system. Raith e-beam lithography system is also installed along side the SEM for rapid pattern generating.

Nova NanoSEM 450 equipped with EDX & e-beam lithography.
Nova NanoSEM 450 equipped with EDX & e-beam lithography.
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